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متالوژی::
میکروسکوپ الکترونی روبشی
Now, in the field, there are many diverse and independent modern methods, such as TEM (including high-resolution variant HRTEM), scanning electron microscopy (SEM including high-resolution variant HRSEM), XRD methods, including small-angle X-ray scattering, glancing-incident angle X-ray diffraction (GIAXRD), extended X-ray absorption fine structure spec- troscopy, X-ray absorption near-edge spectroscopy, energy dispersive spectroscopy (EDS), selected area electron diffraction (SAED), Rutherford backscattering spec- trometry, Auger electron spectroscopy, electron backscattering diffraction (EBSD), atom probe tomography (APT), differential thermal analysis/thermal gravimetric analysis (DTA/TGA), atomic force microscopy, Raman spectroscopy as well as improved or advanced micro/nanoindentation tests and electrical/magnetic mea- surements.
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